INVESTIGATION OF THE EFFECT OF USING VARIOUS OPTICS CONFIGURATONS WITH PROPORTIONAL AND POSITION- SENSITIVE DETECTORS

XRD patterns of NIST standard reference materials were collected using a gas proportional detector and a linear Position Sensitive Detector (PSD). Incident beam optics used for data collection consisted of a polycapillary X-ray lens, a graded multilayer parabolic X-ray mirror, and programmable divergence slits. Peak position, width, and intensity were studied with respect to the different experimental configurations. Bragg-Brentano parafocusing optics resulted in the best resolution and peak position accuracy, though low intensity. The mirror with the PSD resulted in higher intensity, without losses in resolution and accuracy as significant as those seen with the polycapillary lens and the PSD. In addition, when combining incident parallel optics with the PSD, sample surface displacement resulted in considerable peak shift.