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519 皮膜散乱光法によるひずみ分布測定(GS15 計測23)
519 皮膜散乱光法によるひずみ分布測定(GS15 計測23)
2005
yosihiko hayasi
teizou heiya
yasufumi imai
Keywords:
Materials science
Composite material
scattered light
surface strain
Correction
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