Characterization of Electromagnetic Properties of MID Materials for High Frequency Applications up to 67 GHz
2014
This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
5
References
13
Citations
NaN
KQI