Demonstration of a multilayer meanderline at IR
2007
This paper extends these initial efforts and attempts to increase the transmission and bandwidth by using multiple meanderline layers. A new ellipsometric method of characterization allows spectral measurements from 6-14 mum. The use of multiple layers reduces impedance mismatches at each meanderline layer. Therefore less reflection is seen at each interface. A dielectric superstrate layer is also deposited so that an anti-reflection coating may be used to increase the overall transmittance.
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