Piezoelectric composite oscillator for measuring mechanical spectroscopy in small samples that non-match in half wavelength

A novel piezoelectric device for measuring mechanical spectroscopy as a function of temperature and strain has been developed. The new equipment involves five oscillating elements, a crystal driver, two spacer bars, the sample and the crystal gauge. The spacer bars and the sample do not match in frequency. The device developed here results in an important solution for measuring mechanical spectroscopy in small samples, where the condition of match in frequency cannot be satisfied. Mechanical spectroscopy measurements were performed in free decay with the equipment working in an out of tune condition. The associated mathematical equations required for the measurement process have also been developed. In addition, the new equipment was successfully used for the measurement of different types of materials: metals, polymers and ferromagnetic shape memory alloys.