Fractal formation and tunnelling effects on the conductivity of Au/a-Ge bilayer films

The fractal crystallization of the Au/a-Ge bilayer films has been investigated, and the resistance characteristics have been first measured by the two-probe configuration method. The experimental results suggest that the resistance R of various annealing films are influenced by the fractal formation and the fractal dimension. These phenomena were explained by the Random Tunnelling Junction Network (RTJN) model.