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On a Novel Technique for the Electrical Characterization of Polycrystalline Silicon
On a Novel Technique for the Electrical Characterization of Polycrystalline Silicon
2000
Adrian M. Ionescu
Joseph W. Tringe
A. Chovet
James D. Plummer
Keywords:
Polycrystalline silicon
Analytical chemistry
Electronic engineering
Materials science
Linear predictive coding
Silicon
novel technique
Grain size
Network address translation
Correction
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