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Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy
Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy
2018
Xinying Shi
M. Huttula
Vladimir Pankratov
J. Hoszowska
Jean-Claude Dousse
Faisal Zeeshan
Yuran Niu
Alexei Zakharov
Zhongjia Huang
Gang Wang
Sergei Posysaev
Olga Miroshnichenko
M. Alatalo
Wei Cao
Keywords:
Analytical chemistry
X-ray
Materials science
Atom
Metal
Photoemission electron microscopy
Molecular physics
Electron microscope
x ray photoemission
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