The 60° or 180° twinned Bi-doped PbTe film studied by EBSD

Abstract The Bi-doped PbTe film was grown on Si(1 1 1) substrate by using hot wall epitaxy (HWE) technique. The film was characterized by means of scanning electron microscopy, micro-area X-ray diffraction and electron backscatter diffraction (EBSD). The results indicate that the film is dominated by 〈1 1 1〉 orientation. The film consists of two twinned domains, rotated 60° or 180° around the normal to the film surface. It is speculated that the twinned PbTe film results from the deviated triangular grains. The ratio between the grains with two different orientations will decrease with the increase of the film thickness.