Infrared spectroscopic characterization of the properties of oxide films grown on Zr surfaces doped under ion-beam irradiation in a vapor-water medium

Infrared spectroscopy is shown to be applicable to the nondestructive check of the state of oxide films on metal substrates doped under irradiation by an ion beam. The reflection spectra of oxide films on zirconium surfaces doped under ion-beam irradiation are obtained. Oxide films were grown by means of oxidation in a vapor-water medium. The analysis of the fine structure of IR spectra has revealed that, at wavelengths of 1–10 μm, the spectra contain resonance lines corresponding to ZrH-and ZrOH-type molecular compounds, OH groups, and other components of oxide.