Design and Implementation of Dynamic Atomic Force Microscope Simulation System

Abstract Atomic Force Microscopy (AFM) is a tool for the characterization and measurement of nanometer, molecular and atomic resolution materials. The bimodal atomic force microscope developed in recent years is a method based on dynamic atomic force microscopy that simultaneously maps the surface of a sample and detects nanomechanical properties, and the method can simultaneously measure a variety of material properties. In this work, an improved cantilever beam motion model which can simply investigate the relationship between tip-surface interaction force and nanomechanical properties is demonstrated. Then, the theory of this AFM is studied in great detail. Finally, a mathematical model of interaction force and nanomechanical properties is possessed, which can clearly reveal the relationship among amplitude, phase shift and interaction force so as to further explore material’s information such as young's modulus and indentation.