Electro y Foto-Conductividad de Cristales de Silenita Impurificados y con Alta Resistividad

USING THE LONGITUDINAL AND TRANSVERSE ELECTROOPTOC EFFECT WE HAVE MEASURED THE ELECTRO AND PHOTOCONDUCTIVITY INTO THE HIGH RESISTIVITY PHOTOREFRACTIVE SILLENITE CRYSTALS. THE DINAMIC STUDY OF THE DISTRIBUTION OF THE ELECTRIC FIELD IN THE CRYSTAL (TIME AND SPACE SIMULNEOUSKY DETECTED), PERMIT US TO KNOW VERY IMPORTANT SEMICONDUCTOR PARAMETERS, SUCH AS MAJORITY CARRIERS TYPE, MEXWELL'S RELAJATION TIME, THE DRIFT LENGTH (L) OF MAJORITY CARRIERS, THE MOVILITY, THE SCHOTTKY LENGTH (L), AND THE DENSITY OF SPATIAL CHANGE (P) THAT APPEARS IN THE CRYSTAL DURING THE PROCESS OF THE SCREENING OF THE ELECTRICAL FIELD. WE HAVE USED AL, CR, V, CO, FE, AND ND IMPURIFIED SAMPLES. THE OBTAINNED WITH THEIR RESPECTIVE OPTICAL ABSORTION SPECTRA