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Reliability assessment for metallized film pulse capacitors with accelerated degradation test
Reliability assessment for metallized film pulse capacitors with accelerated degradation test
2011
赵建印 Zhao Jianyin
刘芳 Liu Fang
奚文骏 Xi Wenjun
贺少勃 He Shaobo
魏晓峰 Wei Xiaofeng
Keywords:
Nuclear magnetic resonance
Capacitor
Electronic engineering
Physics
Pulse (signal processing)
degradation test
Optics
Correction
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