A Microscopic Marker Technique For Documenting Interface Motion in Corrosion Scales Using TEM
1987
We report here on a microscopic marker technique designed for use with cross-section TEM examination of corrosion scales. The technique involves microphotolithographic methods for sputter deposition of inert markers and has been used to document substrate/scale interface motion during high-temperature oxidation of Ni and Ni-base alloys.
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