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Development of the PIXE analysis technique at high energy with the ARRONAX cyclotron
Development of the PIXE analysis technique at high energy with the ARRONAX cyclotron
2014
D. Ragheb
C. Koumeir
A. Guertin
Ferid Haddad
Vincent Metivier
Nathalie Michel
Noël Servagent
Keywords:
Measuring instrument
Semiconductor detector
Electromagnetic radiation
Optics
high energy
Materials science
Cyclotron
Particle detector
Gamma spectroscopy
Spectroscopy
Correction
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