X‐Ray Diffractometry with Slightly Absorbing Samples

A method for measuring x-ray diffraction intensities of samples which are deeply penetrated, such as liquid and nitreous materials, is described. The sensitive angle of the detector is limited by a scatter slit which is focused on exactly the same area of the sample surface as is illuminated by the primary beam. This scatter slit is placed between the receiving slit and the sample. The absorption correction for the arrangement is given. (C.J.G.)