Optimizing sample illumination scanning for reflection and 4Pi tomographic diffractive microscopy.

Tomographic diffractive microscopy (TDM) is increasingly gaining attention, owing to its high-resolution, label-free imaging capability. Fast acquisitions necessitate limiting the number of holograms to be recorded. Reconstructions then rely on optimal Fourier space filling to retain image quality and resolution, that is, they rely on optimal scanning of the tomographic illuminations. In this work, we theoretically study reflection TDM, and then the 4Pi TDM, a combination of transmission and reflection systems. Image simulations are conducted to determine optimal angular sweeping. We found that three-dimensional uniform scanning fills Fourier space the best for both reflection and 4Pi configurations, providing a better refractive index estimation for the observed sample.