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Spatially Resolved Nano-Scale Characterization of Electronic States in Bi-layer Ruthenates by STM/STS
Spatially Resolved Nano-Scale Characterization of Electronic States in Bi-layer Ruthenates by STM/STS
2005
K. Iwaya
S. Satow
J. P. He
Y. Yoshida
Keywords:
electronic states
characterization
bi layer
Nanoscopic scale
spatially resolved
Optoelectronics
Materials science
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