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Determination of CdSxSe1-x thick films optical properties from reflection spectra
Determination of CdSxSe1-x thick films optical properties from reflection spectra
2016
M. Tivanov
Iryna Kaputskaya
A. Patryn
A. Saad
Ludmila Survilo
Evgenij Ostretsov
Keywords:
Engineering
Optics
Spectral line
Semiconductor
Refractive index
Correction
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