Method and apparatus for determining motion parameters of a conductive, preferably profiled surface

A method and an apparatus for determining motion parameters of a conductive, preferably profiled surface (22) relative to a sensor (3), wherein the sensor (3) comprises at least one coil for generating an electromagnetic alternating field, which due to the feedback as a result of changes in position between the surface (22) and the sensor (3) is subject to a change, by means of the coil (16) is detected, is configured such that the change in position from the coupling impedance (Z