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Large memory window with low operating voltages using Hf1.5Gd2O6 charge trapping layer and thin MoS2 channel
Large memory window with low operating voltages using Hf1.5Gd2O6 charge trapping layer and thin MoS2 channel
2021
Zhaohao Zhang
Yaoguang Liu
Qianhui Wei
Qingzhu Zhang
Junjie Li
Feng Wei
Zhenhua Wu
Huaxiang Yin
Keywords:
Optoelectronics
memory window
Trapping
Charge (physics)
layer
Communication channel
Materials science
Voltage
Correction
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