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Reliability of 60-nm scale CAAC-IGZO FET
Reliability of 60-nm scale CAAC-IGZO FET
2018
H. Kimura
D. Shimada
N. Kamata
M. Motoyoshi
Y. Asami
K Sugaya
R. Hodo
T. Murakawa
M. Takahashi
S Yamazaki
Keywords:
Optoelectronics
Materials science
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