Shanghai electron beam ion trap: design and current status

2004 
A new electron beam ion trap (EBIT) is under constructiin in Shanghai. In this paper we describe the design and the features of this apparatus. Finally the current status of Shanghai EBIT is shown.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    5
    References
    6
    Citations
    NaN
    KQI
    []