The effect of enhancement factor on the angular dependence of L x-ray intensity ratios for Sm, Hf, Pb and U

Abstract The effect of enhancement factor on the angular dependence of L l / L γ , L α / L γ and L β / L γ X-ray intensity ratios for Sm, Hf, Pb and U elements have been measured by using the 59.54 keV photon energy. The binary systems are prepared as Sm-CeO2, Hf-CeO2, Pb–CeO2 and U–CeO2. The samples have been analyzed in EDXRF system. The measurements are made in scattering angles of 85°, 95°, 105°, 115° and 125°. The L X-ray spectra from different samples were detected by a Si(Li) detector. The results show that the intensity ratios of L X-rays to be greater than expected due to the enhancement effect.