2 Dimensional Temperature Measurement on YBCO Thin Film During S/N Transition Period by use of RuO2 Chip Resistor

Abstract InS/Ntransition type Superconductingfault current limiter (SFCL),S/Ntransition process affects theburnout and the generated resistance during limiting operation. Thus, it is important to clarify the detail ofS/Ntransition process. In this study, resistive type SFCL by use of YBCO thin film is focused, and temperature distribution on YBCO thin film is measured duringS/Ntransition. RuO2 chip resistors are used as the thermal sensors. The temperature is measured on 30 points, and heat generation process is observed with the temperature distribution. In addition, the potential distribution on thin filmis measuredin same condition as temperature measurement.Temperature distributionis compared with the potential distribution to examine the accuracyof the temperature measurement results.