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Combining X-Ray Thomson Scattering and X-Ray Raman Spectroscopy to Characterize Solid-Density Plasmas
Combining X-Ray Thomson Scattering and X-Ray Raman Spectroscopy to Characterize Solid-Density Plasmas
2020
Dominik Kraus
K. Voigt
Min Zhang
Kushal Ramakrishna
N. J. Hartley
A. K. Schuster
Jan Vorberger
Lingen Huang
Deniza Chekrygina
Michal Smid
Toma Toncian
Alexander Pelka
Katerina Falk
Marion Harmand
Alexis Amouretti
Stefan P. Hau-Riege
Tilo Doeppner
Luke Fletcher
Hae Ja Lee
Bob Nagler
Roger Falcone
M. Makita
Karen Appel
T. R. Preston
Ulf Zastrau
Keywords:
Raman spectroscopy
Materials science
Plasma
X-ray
Atomic physics
solid density
Thomson scattering
Correction
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