Photolithography study for advanced packaging technologies

In recent years, demand for high density integration of semiconductor chips has steadily increased due to miniaturization and high-performance requirements of electronics including Smartphones and Tablet PCs. In addition to 3D integration using Through Silicon Via (TSV) technology and 2.5D integration technology using silicon interposers, Fan-Out Wafer Level Packaging (FOWLP) using redistribution processes over chip size has become a hot topic these days.