Effect of etching on exchange bias in CoFe/IrMn bilayers studied by soft X-ray XMCD and resonant magnetic reflectometry

D. ODonnell,Alevtina Smekhova,H. Wende,R Fan,P. Steadman,Yuqing Du,Sameh Sayed Ali Hassan,A. Dobrynin

Effect of etching on exchange bias in CoFe/IrMn bilayers studied by soft X-ray XMCD and resonant magnetic reflectometry

2017

D. ODonnell
Alevtina Smekhova
H. Wende
R Fan
P. Steadman
Yuqing Du
Sameh Sayed Ali Hassan
A. Dobrynin

Exchange biased (EB) antiferromagnetic (AFM) - ferromagnetic (FM) bilayers are essential parts of modern spintronic devices, such as spin valve sensors or magnetic random access memory.

Keywords:

Reflectometry
Exchange bias
Condensed matter physics
Magnetic hysteresis
Spin valve
Antiferromagnetism
Spintronics
Nuclear magnetic resonance
Materials science
Ferromagnetism
Magnetic resonance imaging
Etching

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