Old Web
English
Sign In
Acemap
>
Paper
>
Non-Destructive Measurement of Graphene Defects using Induced Voltage
Non-Destructive Measurement of Graphene Defects using Induced Voltage
2017
Sumin Kang
Taeshik Yoon
Tae-Yeob Kang
Taek-Soo Kim
Keywords:
Graphene
Composite material
Materials science
Voltage
non destructive
induced voltage
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]