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Impact of heavy ion particle strike induced single event transients on conventional and π – Gate AlGaN/GaN HEMTs
Impact of heavy ion particle strike induced single event transients on conventional and π – Gate AlGaN/GaN HEMTs
2021
Khushwant Sehra
Vandana Kumari
Mridula Gupta
Meena Mishra
Dipendra Singh Rawal
Manoj Saxena
Keywords:
Particle
Materials science
heavy ion
Optoelectronics
algan gan
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