A Location Method for Reliability-Critical Paths Based on Monte Carlo Search Tree

The development of nanoscale technology for integrated circuit chips highlights the reliability of circuit reliability. The path formed by the basic unit of the circuit has a significant influence on the overall reliability of the circuit. Therefore, it is necessary to quickly and effectively locate the path to understand the difference in reliability between logic circuits of different structures in time. Combined with the Monte Carlo tree search strategy and based on relaxation operations, this paper realizes the rapid location of sensitive paths in the combinational circuit while ensuring the accurate location of sensitive paths.