Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.