Old Web
English
Sign In
Acemap
>
Paper
>
Influence of RF sputtering power and thickness on structural and optical properties of NiO thin films
Influence of RF sputtering power and thickness on structural and optical properties of NiO thin films
2019
T. Potlog
L. Ghimpu
V Suman
Aida Pantazi
Marius Enachescu
Keywords:
Non-blocking I/O
Optoelectronics
Thin film
Sputtering
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
38
References
3
Citations
NaN
KQI
[]