The temperature dependence of superlattice spots in electron diffraction patterns of thin layers of AgxTiS2 formed by electrointercalation

Abstract A double-Faraday-cup attachment for an electron microscope has been used to measure R ( T ) where R is the ratio (intensity of a satellite spot divided by intensity of a matrix spot) in transmission electron diffraction patterns from TiS 2 into which silver had been electrointercalated to form Ag x TiS 2 with x = 0.2 and x = 0.49 and T is the temperature (100 to about 300 k). The curves of R(T) R(100) vs. T are the same within experimental error for both values of x and can be fitted by B( 1 − T c T ) β where T c has a gaussian probability distribution with a mean value of about 260 K. The results are compared with those obtained from Raman scattering and X-ray studies.