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OS5(2)-8(OS05W0121) Quantitative Analysis of the Striation Topography by Using Fractal and Chaos Parameters
OS5(2)-8(OS05W0121) Quantitative Analysis of the Striation Topography by Using Fractal and Chaos Parameters
2003
Akira Ueno
Hidehiro Kishimoto
Keywords:
Computational physics
Lyapunov exponent
Atomic force microscopy
Quantitative analysis (chemistry)
Striation
Fractal dimension
Geography
Analytical chemistry
Fractal
Statistical physics
stress ratio
Correction
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