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Decorated dislocations with fine precipitates observed by FIB-SEM slice-sectioning tomography
Decorated dislocations with fine precipitates observed by FIB-SEM slice-sectioning tomography
2015
Rika Kawano
Kenji Kaneko
Toru Hara
Kazuhiro Yamada
Yukio Sato
Kenji Higashida
Masao Kikuchi
Keywords:
Materials science
Metallurgy
Composite material
Precipitation (chemistry)
Tomography
Wafer
Dislocation
Correction
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