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Scanning Probe Characterization of Memristors Based on a Li Intercalation Metal Oxide
Scanning Probe Characterization of Memristors Based on a Li Intercalation Metal Oxide
2016
Elliot J. Fuller
Farid El Gabaly
Nicholas Ware
Raymond W. Friddle
David R. Hughart
Matthew Marinella
A. Alec Talin
Keywords:
Oxide
Nanotechnology
Intercalation (chemistry)
Memristor
Metal
Inorganic chemistry
Materials science
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