Structural phase transitions in epitaxial SrRuO3 thin films

The microstructural evolution of epitaxial SrRuO3 thin films from ambient temperature (about 293K) to about 900K has been studied by in-situ transmission electron microscopy. Upon heating from the ambient temperature, the intensities of h, k, 2n+1 and h, -h+2n+1, 0 reflections in selected-area electron diffraction patterns decrease with increasing temperature. Two structural phase transitions were observed at about 673and about 783K, revealed by the vanishing of the h, k, 2n+1 and h,-h+2n+1, 0 reflections respectively. The examination of electron diffraction patterns along several different zone axes, taking into account the possible tilting configurations of RuO6 octahedra, indicates that, upon heating, the orthorhombic structure of SrRuO3 transforms into a tetragonal structure at about 673K, and further transforms into a cubic structure at about 783K. Possible structural models for the high-temperature phases are considered.