Flux creep characteristics after the increase in temperature or external field

Abstract The parameters of power-law magnetic relaxation; M s , R and β, have been studied on a laser-ablated YBCO thin film. It was found that at given T and H, M s was almost independent on measuring process. R and β obtained from fixed H and step-increased T process were respectively larger than those from fixed T and step-increased H process. These demonstrated that the rate of flux creep is more influenced by Lorentz force than by thermal activation factor.