Structure and microwave dielectric properties of NaSr4V5O17 ceramics for LTCC applications

Abstract A new microwave dielectric ceramic, NaSr4V5O17 with low firing temperature was fabricated via the traditional mixed oxide method. Rietveld refinement of XRD profiles and Raman spectrum analysis ascertained that the NaSr4V5O17 compounds crystallized into Sr2V2O7-like triclinic structure with space group P-1 (2) and Z=1.6. The variation of Q×f value was explained by the combined effects of mean grain size and cell volume rather than packing fraction and bond valence. The change regulation of er was similar to that of density. The |τf| value is mainly related to the cations bond valence. The NaSr4V5O17 ceramics sintered at 725 oC showed good compatibility with Ag electrode and superior dielectric properties: er=8.6, Q×f=45 900 GHz, τf=-57.0 ppm/K, making it a potential application for LTCC.