Reliability of Large Area Solder Joints within IGBT Modules: Numerical Modeling and Experimental Results

Long term reliability is a key requirement for IGBT modules. Besides wire bond degradation solder degradation is a main mechanism leading to IGBT module failures. A numerical model was developed to describe the solder degradation process. The model includes elastic and (time independent) plastic deformation, as well as primary and secondary creep. To verify the model it was successfully applied to different temperature cycle experiments with SnPb solder as well as SnAgCu solder. It was found that primary creep cannot be neglected for SnAgCu solders.