Projection of speckle patterns for 3D sensing

In this communication we present the use of projected speckle patterns coming from a phase random mask for sensing depths and thicknesses. The sensing is based on the change of the speckle pattern with propagation and the lack of correlation between speckle patterns recorded at different depths or lateral locations. The principle is used for mapping thickness of transparent media, for depth ranging and for 3D mapping of diffuse objects.