A New Probe for Characterizing Elliptically Polarized Microwave Fields

Recent research advances into applying microwave technology to characterize the physical properties of various orthotropic materials have created the need to identify elliptically polarized electromagnetic fields rapidly and efficiently. This paper presents a new microwave probe design consisting of multiple dipoles. The new probe has the capability to measure field information along different directions. Thus, the direction of the major and minor axes of the electric field ellipse can be determined together with the ratio of the two principalfield amplitudes without mechanical movement. This paper presents the theoretical basis for a new probe, and illustrates its use through an application example involving wood property measurement.