Charge spectroscopy of Si nanocrystals in a SiO2 matrix [Phys. Status Solidi C 6, No. 12, 2704–2706 (2009)]

Due to a regrettable error during the production process the author's list contains an error. The corrected list of authors with the assignment to the affiliations is as follows: Irina Antonova1, Efim Neustroev2, Svetlana Smagulova2, Jedrzej Jedrzejewski3, and Isaac Balberg3 1 Institute of Semiconductor Physics, SB RAS, 630090, Lavrentieva 13, Novosibirsk, Russia 2 Yakutsk state University, Yakutsk, Russia 3 The Racah Institute of Physics, The Hebrew University, Jerusalem, Israel