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Single event upset sensitivity of a SRAM: An overview from testing procedures to device hardening (theme 2)
Single event upset sensitivity of a SRAM: An overview from testing procedures to device hardening (theme 2)
1991
Olivier Musseau
J.-L. Leray
Y.M. Coic
Y. Patin
Keywords:
Computer simulation
Failure mode and effects analysis
CMOS
Static random-access memory
Electronic engineering
Single event upset
Hardening (computing)
Materials science
Correction
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