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Defect Analyses Using TEM of a-In 2 O 3 Grown by Mist CVD on a-Al 2 O 3 Substrate
Defect Analyses Using TEM of a-In 2 O 3 Grown by Mist CVD on a-Al 2 O 3 Substrate
2021
Yuka Hayakawa
Soichiro Ohno
Tomohiro Yamaguchi
Takanori Kiguchi
Subaru Takahashi
Yokoo Hirokazu
Takeyoshi Onuma
Tohru Honda
Keywords:
Transmission electron microscopy
Chemical engineering
Substrate (chemistry)
Mist
Materials science
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