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Calibration of multilayer semiconducting spectrometer by means of α-sources
Calibration of multilayer semiconducting spectrometer by means of α-sources
2006
Yu. B. Gurov
V. S. Karpukhin
S. V. Lapushkin
P. V. Morokhov
K. N. Gusev
V.G. Sandukovskij
J. Yurkowski
Keywords:
Particle detector
Calibration
Spectrometer
Semiconductor detector
Measuring instrument
Optics
Materials science
Correction
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