Effect of Plane Strain Compression and Subsequent Recrystallization Annealing on Microstructures and Phase Transformation of NiTiFe Shape Memory Alloy

The effect of plane strain compression and subsequent recrystallization annealing on microstructures and phase transformation of NiTiFe shape memory alloy (SMA) is investigated. Inhomogeneous plastic deformation at various deformation degrees occurs in NiTiFe SMA during plane strain compression. Nanocrystalline phase and amorphous phase increase as the deformation degree increases. B2 austenite, B19′ martensite, nanocrystalline and amorphous phases coexist in the NiTiFe samples subjected to large plastic strain. The static recrystallization mechanisms depend on the microstructures of the deformed NiTiFe samples. The static recrystallization mechanisms deal with nucleation and growth of the recrystallized grains, growth of nanocrystalline phase and crystallization of amorphous phase. Grain size, subgrain boundaries, geometrically necessary dislocation density and Schmid factor are captured on the basis of electron backscattered diffraction data. The process of recrystallization annealing cannot eliminate the deformation texture completely. The slip direction [110] is the most favorable slip direction in the recrystallized NiTiFe sample. Plane strain compression along with subsequent recrystallization annealing changes the phase transformation path of as-rolled NiTiFe SMA, and it results in the decreasing martensite transformation start temperature. The three annealed NiTiFe samples exhibit the similar phase transformation behavior since complete recrystallization annealing leads to the similar microstructures.