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Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller
Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller
2018
Nakano Hiroki
Kishida Ryo
Furuta Jun
Kobayashi Kazutoshi
Keywords:
Field-programmable gate array
Microcontroller
Oscillation
Degradation (geology)
Electronic engineering
Materials science
Correction
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