Single event effects hardening and characterization of Honeywell's RHPPC integrated circuit
2003
We describe SEE testing of Honeywell's radiation-hardened RHPPC processor chip, which is functionally and pin-compatible with the commercial PowerPC603e/spl trade/. Results support an upset rate of 1.1/spl times/10/sup -5/ upsets/chip-day in geosynchronous orbit.
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